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Volumn 53, Issue 3, 2006, Pages 729-734

Production performance of the ATLAS semiconductor tracker readout system

Author keywords

ATLAS; Data acquisition; Quality control; Silicon radiation detectors

Indexed keywords

ATLAS; ELECTRONICS DESIGN; SILICON RADIATION DETECTORS;

EID: 33746345875     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2006.874727     Document Type: Article
Times cited : (5)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.