Spray characterization in high pressure environment using optical line patternator

Measurement Science and Technology

Volumn 17, Issue 8, 2006, Pages 2159-2167

  Koh, Hyeonseok ^a,b   Kim, Dongjun ^a   Shin, Sanghee ^a   Yoon, Youngbin ^a  

^a Seoul National University   (South Korea)

^b Korea Aerospace Research Institute (KARI)   (South Korea)

Author keywords

Extinction; High ambient pressure; Imaging technique; Patternation; Spray

Indexed keywords

CHARGE COUPLED DEVICES; IMAGING TECHNIQUES; LASER BEAMS; LIGHT SCATTERING; MEASUREMENT THEORY; SWIRLING FLOW;

EXTINCTION; HIGH AMBIENT PRESSURES; PATTERNATION; SPRAY;

SPRAYING;

CHARGE COUPLED DEVICES; IMAGING TECHNIQUES; LASER BEAMS; LIGHT SCATTERING; MEASUREMENT THEORY; SPRAYING; SWIRLING FLOW;

EID: 33746273736     PISSN: 09570233     EISSN: 13616501     Source Type: Journal    
DOI: 10.1088/0957-0233/17/8/015     Document Type: Article

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