Thickness dependence of microstructures in la0.8Ca 0.2MnO3 thin films

Journal of Applied Physics

Volumn 100, Issue 1, 2006, Pages

  Zhang, H D ^a   Li, M ^a   An, Y K ^a   Mai, Z H ^a   Gao, J ^b   Hu, F X ^b   Wang, Y ^c   Jia, C J ^c  

^a INSTITUTE OF PHYSICS   (China)

^b UNIVERSITY OF HONG KONG   (Hong Kong)

^c INSTITUTE OF HIGH ENERGY PHYSICS   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; LANTHANUM COMPOUNDS; SCANNING ELECTRON MICROSCOPY; THIN FILMS; X RAY DIFFRACTION;

CRYSTALLINE GRAINS; FILM THICKNESS; SUBSTRATE SURFACES; THICKNESS DEPENDENCE;

MICROSTRUCTURE;

EID: 33746216107     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2210147     Document Type: Article

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