Simplified ATPG and Analog Fault Location Via a Clustering and Separability Technique

IEEE Transactions on Circuits and Systems

Volumn 26, Issue 7, 1979, Pages 496-505

  Varghese, K C ^a   Williams, Hywel J ^a   Towill, Denis R ^a  

^a CARDIFF UNIVERSITY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

AUTOMATIC TESTING;

ELECTRIC NETWORKS;

EID: 0018495334     PISSN: 00984094     EISSN: None     Source Type: Journal    
DOI: 10.1109/TCS.1979.1084664     Document Type: Article

References (29)

1. W. A. Plice, “Task group IB industry/joint services—Automatic test program generation,” Honeywell Avionics Division, St. Louis Park, MN.
2. R. Knowles, Automatic Testing—Systems and Applications. New York: McGraw-Hill, 1976.
3. W. A. Plice, “Automatic generation of fault isolation tests for analog circuit boards—A survey,” presented at ATEX EAST ‘78, Boston, MA, Sept. 26–28, 1978.
4. D. J. Bainton, A. R. Rowlands, D. R. Towill, and J. H. Williams, “Software development for analog avionic system fault diagnosis at an ATE test station,” presented at Automatic Testing ‘78, Paris, Oct. 23–26, 1978.
5. P. A. Payne, D. R. Towill, and K. J. Baker, “Predicting servomechanism dynamic performance variation from limited production test data,” Radio Electron. Eng., vol. 40, no. 6, pp 275–88, Dec. 1970.
6. H. C. Andrews, Introduction to Mathematical Techniques in Pattern Recognition. New York: Wiley, 1972.
7. T. Kailath, “The divergence and bhattacharyya distance measures in signal detection,” IEEE Trans. Commun. Technol. vol. COM-15, pp 52–66, Feb. 1967.
8. C. H. Chen, Statistical Pattern Recognition. Rochelle Park, NJ: Hayden (Spartan Books). 1973.
9. L. Canal, “Patterns in pattern recognition: 1968-1974,” IEE. Trans. Inform. Theory, vol. IT-20, pp 697–722, Nov. 1974.
10. C. Nagy, “State of the art in pattern recognition,” in Proc. IEEE; vol. 836–862.
11. K. C. Varghese, “Optimization of feature selection and fault diag. nosis in analogue systems,” M.Eng. (System Test Technology) dissertation, Univ. of Wales Inst. of Technol., Cardiff, U.K., 1977
12. G. H. Bell, “A comparison of some cluster seeking techniques,’ Rome Air Development Center, Rome, NY Tech. Rep. RADC TR 66–514, Nov. 1966.
13. G. Nagy, “Feature extraction on binary patterns,” IEEE Trans Syst. Sci. Cybern., vol. SSC-5, pp 273–278, Oct. 1969.
14. C. Abraham, “Evaluation of clusters on the basis of random grapt theory,” IBM Corp., Yorktown Heights, NY Res. Memo, 1962.
15. K. Fukunga and W. L. G. Koontz, “A criterion and algorithm for grouping data,” IEEE Trans. Comp. vol. C-19, pp 917–923, Oct 1970.
16. R. O. Duda and P. E. Hart, “Pattern classification and scent analysis,” NY: Wiley, 1973.
17. H. V. Harley and D. R. Towill, “Automation of large electro-mechanical system testing,” J. Naval Sci., vol. 2, no. 2, pp 128–136, 136, May 1976.
18. S. D. Bedrosian, J. H. Lee, and C. W. C. Shen, “Learning tech. niques applied to analog fault testing,” in Proc. 1977 Autotestcon Hyannis, MA, 233–239.
19. H. Sriyananda, D. R. Towill, and J. H. Williams, “Voting technique for fault diagnosis from frequency domain test data,” IEEE Trans. Rel., vol. 24, pp 260–267, Oct. 1975.
20. R. F. Garzia, “Fault isolation computer methods,” NASA Con. tractor Rep. CR-1758, Feb. 1971.
21. V. S. Levadi, “Pattern recognition applied to fault detection,” in Proc. IEEE Convention Mil. Electron., Washington, DC, Sept 1965, pp 197–202.
22. E. Fix and J. L. Hodges, Jr. “Discriminatory Analysis, non-para. metic discrimination: Consistency properties,” USAF School of Aviation, Medicine Project Rep., Feb. 1959.
23. D. R. Towill and Z. Mehdi, “Prediction of transient response sensitivity of high order linear systems using low order lineal models,’ Trans. Inst. Meas. Cont., vol. 3, no. 1, pp T1—T9, 1970.
24. M. L. Shaman, Probabilistic Reliability: An Engineering Approach, NY: McGraw-Hill, 1968.
25. S. A. Lapp and G. I. Powers, “Computer aided synthesis of fault-trees,” IEEE Trans. Rel., vol. R-26, pp 2–13, Apr. 1977.
26. D. R. Towill and P. A. Payne, “Frequency domain approach to automatic testing of control systems, Radio Electron. Eng., vol. 41, no. 2, pp 51–60, Feb. 1971.
27. J. H. Williams, “Probabilistic models for quality assurance,” Ph.D. dissertation, Univ. of Wales Inst. of Technol., Cardiff, 1977.
28. K. C. Varghese and D. R. Towill, “Choosing test frequencies fot fault isolation in an aerospace compensation unit,” in Proc. Fifth Nat. Syst. Conf., Punjab Agricultural University, Ludhiana, India, Sept. 4–6, 1978.
29. K. C. Varghese, J. H. Williams, and D. R. Towill, “Computer aided feature selection for enhanced analogue system fault location,” Pattern Recognition, vol. 10, pp 265–280, 1978.