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Volumn 48, Issue 6, 2006, Pages 1583-1587

Piezoelectric properties of highly oriented lead-free Na 0.5K 0.5NbO 3 films as determined using piezoelectric force microscopy

Author keywords

Lead free piezoelectric material; NKN; PFM; Piezoelectric constant; PLD

Indexed keywords


EID: 33746085986     PISSN: 03744884     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (23)

References (14)
  • 5
    • 33746041886 scopus 로고
    • edited by K-H. Hellwege (Springer, New York)
    • Toshio Mitsui et al., Landolt-Bornstein, edited by K-H. Hellwege (Springer, New York, 1969), p. 289.
    • (1969) Landolt-Bornstein , pp. 289
    • Mitsui, T.1
  • 11
    • 27644473014 scopus 로고    scopus 로고
    • a dissertation for the degree of Doc tor of Philosophy, Maryland University
    • Chandan S. Ganpule, Nanoscale Phenomena in Ferroelectric Thin Films (a dissertation for the degree of Doc tor of Philosophy, Maryland University, 2001), p. 44.
    • (2001) Nanoscale Phenomena in Ferroelectric Thin Films , pp. 44
    • Ganpule, C.S.1
  • 12


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.