Finite element modeling and simulation of Piezoelectric wafer active sensors interaction with the host structure for structural health monitoring

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 6174 II, Issue , 2006, Pages

  Liu, Weiping ^a   Giurgiutiu, Victor ^a  

^a The Department of Mechanical Engineering   (United States)

Author keywords

Coupled field analysis; E M impedance; Finite element analysis; Lamb wave; PWAS; Structural Health Monitoring; Wave propagation

Indexed keywords

ACTUATORS; COMPUTER SIMULATION; CONDITION MONITORING; CRACKS; FINITE ELEMENT METHOD; PIEZOELECTRIC DEVICES; SILICON WAFERS;

COUPLED FIELD ANALYSIS; E/M IMPEDANCE; LAMB WAVE; PWAS; STRUCTURAL HEALTH MONITORING;

OPTICAL SENSORS;

EID: 33745941798     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.658501     Document Type: Conference Paper

References (13)

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