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Volumn 20, Issue , 2001, Pages 1-22

A vision of ultrasonic guided wave inspection potential

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SOFTWARE; NONDESTRUCTIVE EXAMINATION; SENSORS; TECHNOLOGY TRANSFER; WAVE PROPAGATION;

EID: 0242408739     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (43)

References (40)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.