Characterization of CdTe thin films prepared by stacked layer method

Journal of Optoelectronics and Advanced Materials

Volumn 7, Issue 4, 2005, Pages 1957-1964

  Rusu, G G ^a   Rusu, M ^a   Polychroniadis, E K ^b   Lioutas, C ^b  

^a ALEXANDRU IOAN CUZA UNIVERSITY OF IASI   (Romania)

^b ARISTOTLE UNIVERSITY OF THESSALONIKI   (Greece)

Author keywords

Cadmium telluride; Electrical properties; Optical properties; Thin films

Indexed keywords

CADMIUM TELLURIDE; CRYSTALLINITY; DEPOSITION; ELECTRIC PROPERTIES; II-VI SEMICONDUCTORS; LIGHT TRANSMISSION; MORPHOLOGY; NANOCRYSTALS; OPTICAL PROPERTIES; SUBSTRATES; SURFACE MORPHOLOGY; TEMPERATURE DISTRIBUTION; THERMAL EVAPORATION; THIN FILMS; VACUUM EVAPORATION;

DEPOSITION PARAMETERS; EFFECT OF HEAT TREATMENTS; EVAPORATION PROCESS; FILM CHARACTERISTICS; FILM CRYSTALLINITY; ROTATING FREQUENCIES; TEMPERATURE DEPENDENCE; TRANSMISSION AND ABSORPTION;

OPTICAL FILMS;

EID: 24644495145     PISSN: 14544164     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Conference Paper

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