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Volumn 47, Issue 15, 2006, Pages 5566-5573

In situ atomic force microscopy of the melting of melt-crystallized polyethylene

Author keywords

Atomic force microscopy; Melting; Polyethylene

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTAL GROWTH; CRYSTAL STRUCTURE; CRYSTALLOGRAPHY; HIGH TEMPERATURE OPERATIONS; MELTING;

EID: 33745885939     PISSN: 00323861     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.polymer.2005.02.133     Document Type: Article
Times cited : (28)

References (26)
  • 20
    • 33745905253 scopus 로고    scopus 로고
    • Hobbs JK, Humphris ADL, Miles MJ. In: Batteas JD, Michaels CA, Walker GC, editors. Applications of scanned probe microscopy to polymers ACS Symposium Series 897, 2005;194.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.