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Volumn 292, Issue 2, 2006, Pages 404-407

Growth habits and characterization of Sr3NbGa3Si2O14 crystal

Author keywords

A1. Crystal structure; A1. Facet; A1. X ray diffraction; A2. Czochralski method; B1. Gallium compounds; B2. Piezoelectric materials

Indexed keywords

CRYSTAL GROWTH; CRYSTAL STRUCTURE; ETCHING; PIEZOELECTRIC MATERIALS; X RAY POWDER DIFFRACTION;

EID: 33745870833     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcrysgro.2006.04.044     Document Type: Article
Times cited : (13)

References (16)
  • 3
    • 33745856367 scopus 로고    scopus 로고
    • M.F. Dubovik, I.A. Andreyev, Yu.S. Shmaly, Proceedings of the 1994 IEEE International Freq. Cont. Symposium., p. 43.
  • 8
    • 0035170695 scopus 로고    scopus 로고
    • M.M.C. Chou, S. Jen, B.H.T. Chai, IEEE International Freqency Control Symposium and PDA Exhibition, 2001, p. 250.
  • 9
    • 33745831686 scopus 로고    scopus 로고
    • B.H.T. Chai, A.N.P. Bustamance, M. Chou, Proceedings of 2000 IEEE Freqency Control Symposium, p. 163.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.