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Volumn 292, Issue 2, 2006, Pages 404-407
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Growth habits and characterization of Sr3NbGa3Si2O14 crystal
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Author keywords
A1. Crystal structure; A1. Facet; A1. X ray diffraction; A2. Czochralski method; B1. Gallium compounds; B2. Piezoelectric materials
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Indexed keywords
CRYSTAL GROWTH;
CRYSTAL STRUCTURE;
ETCHING;
PIEZOELECTRIC MATERIALS;
X RAY POWDER DIFFRACTION;
ABSORPTION EDGE;
CZOCHRALSKI METHOD;
ETCH PATTERNS;
FACET;
STRONTIUM COMPOUNDS;
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EID: 33745870833
PISSN: 00220248
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jcrysgro.2006.04.044 Document Type: Article |
Times cited : (13)
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References (16)
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