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Volumn 249, Issue 1-2 SPEC. ISS., 2006, Pages 126-128

Characterization of implanted ion sites by X-ray absorption spectroscopy

Author keywords

Ion implantation; Phase formation; X ray absorption spectroscopy

Indexed keywords

ABSORPTION SPECTROSCOPY; METAL INSULATOR BOUNDARIES; NEGATIVE IONS; X RAY ANALYSIS;

EID: 33745830511     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2006.03.096     Document Type: Article
Times cited : (1)

References (6)
  • 6
    • 33745860527 scopus 로고    scopus 로고
    • A. Michalowizc, Logiciels pour la Chimie, 102, Ed. Société Française de Chimie, Paris, 1991.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.