Less biased measurement of feature selection benefits

Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)

Volumn 3940 LNCS, Issue , 2006, Pages 198-208

  Reunanen, Juha ^a  

^a ABB OY   (Finland)

Author keywords

[No Author keywords available]

Indexed keywords

CLASSIFICATION (OF INFORMATION); COMPUTATIONAL METHODS; COMPUTER SCIENCE; MEASUREMENT THEORY; PARAMETER ESTIMATION; PROBLEM SOLVING; SET THEORY; VIRTUAL REALITY;

CROSS-VALIDALION; FEATURE SELECTION; OVERFILLING; SUBSET SIZE;

FEATURE EXTRACTION;

EID: 33745816725     PISSN: 03029743     EISSN: 16113349     Source Type: Book Series    
DOI: 10.1007/11752790_14     Document Type: Conference Paper

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