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Volumn 89, Issue 1, 2006, Pages
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Atomic force microscopy based, multiphoton, photoelectron emission imaging
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Author keywords
[No Author keywords available]
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Indexed keywords
METALLIC SURFACES;
MULTIPHOTON PHOTOELECTRIC EFFECTS;
PHOTOELECTRON EMISSION IMAGING;
TWO-METAL PATTERNED SAMPLES;
ATOMIC FORCE MICROSCOPY;
LIGHTING;
PHOTOELECTRICITY;
PHOTOEMISSION;
PHOTONS;
PULSED LASER APPLICATIONS;
SURFACE PROPERTIES;
IMAGE PROCESSING;
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EID: 33745798794
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.2219120 Document Type: Article |
Times cited : (7)
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References (16)
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