TEM microstructures of X7R type base-metal-electroded BaTiO3 capacitor materials co-doped with MgO/Y2O3 additives

Ferroelectrics

Volumn 332, Issue , 2006, Pages 41-44

  Chen, Cheng Sao ^a,b   Chou, Chen Chia ^a   Yang, Wei Chun ^c   Lin, I Nan ^d  

^a NATIONAL TAIWAN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Taiwan)

^b HWA HSIA INSTITUTE OF TECHNOLOGY   (Taiwan)

^c WALSIN TECHNOLOGY CORPORATION   (Taiwan)

^d TAMKANG UNIVERSITY   (Taiwan)

Author keywords

Base metal electroded capacitor; Core shell microstructure; Transmission electron microscopy; X7R type capacitor

Indexed keywords

BARIUM TITANATE; DOPING (ADDITIVES); MICROSTRUCTURE; PERMITTIVITY; SINTERING; TRANSMISSION ELECTRON MICROSCOPY; BARIUM COMPOUNDS; CAPACITORS; DIELECTRIC PROPERTIES; ELECTRODES; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; MATERIALS PROPERTIES; SHELLS (STRUCTURES);

BASE-METAL-ELECTRODED CAPACITORS; CORE-SHELL MICROSTRUCTURES; DIELECTRIC CONSTANT-TEMPERATURE (K-T CURVE) PROPERTIES; X7R-TYPE CAPACITORS;

CERAMIC CAPACITORS; DIELECTRIC MATERIALS;

BASE METAL ELECTRODED CAPACITORS; BASE METALS; CAPACITOR MATERIALS; CONSTANT TEMPERATURE; CORE SHELL; PRIME FACTORS; PROCESSING PARAMETERS; SHELL THICKNESS;

EID: 33745748748     PISSN: 00150193     EISSN: 15635112     Source Type: Conference Proceeding    
DOI: 10.1080/00150190500323529     Document Type: Article

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