Surface plasmon delocalization by short-range correlations in percolating metal systems

Applied Physics B: Lasers and Optics

Volumn 84, Issue 1-2, 2006, Pages 205-210

  Genov, D A ^a   Seal, K ^b   Sarychev, A K ^c   Noh, H ^b   Shalaev, V M ^d   Ying, Z C ^e   Zhang, X ^a   Cao, H ^b  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b NORTHWESTERN UNIVERSITY   (United States)

^c Ethertronics Inc   (United States)

^d PURDUE UNIVERSITY   (United States)

^e NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EIGENVALUES AND EIGENFUNCTIONS; ELECTROMAGNETISM; HAMILTONIANS; METALLIC FILMS; NEAR FIELD SCANNING OPTICAL MICROSCOPY;

NEAR-FIELD MEASUREMENT; PERCOLATING SILVER FILMS; SEMICONTINUOUS METAL FILMS; SHORT-RANGE CORRELATIONS;

SURFACE PLASMON RESONANCE;

EID: 33745712663     PISSN: 09462171     EISSN: None     Source Type: Journal    
DOI: 10.1007/s00340-006-2229-7     Document Type: Article

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