Robust locally testable codes and products of codes

Random Structures and Algorithms

Volumn 28, Issue 4, 2006, Pages 387-402

  Ben Sasson, Eli ^a   Sudan, Madhu ^b  

^a TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

^b MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33745711597     PISSN: 10429832     EISSN: 10982418     Source Type: Journal    
DOI: 10.1002/rsa.20120     Document Type: Article

References (28)

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