Randomness-efficient low degree tests and short PCPs via epsilon-biased sets

Conference Proceedings of the Annual ACM Symposium on Theory of Computing

Volumn , Issue , 2003, Pages 612-621

  Ben Sasson, Eli ^a   Vadhan, Salil ^a   Sudan, Madhu ^b   Wigderson, Avi ^c,d  

^a HARVARD UNIVERSITY   (United States)

^b MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

^c INSTITUTE FOR ADVANCED STUDY   (United States)

^d HEBREW UNIVERSITY OF JERUSALEM   (Israel)

Author keywords

Linearity Testing; Locally Testable Codes; Low Degree Testing; Probabilistically Checkable Proofs; Property Testing

Indexed keywords

COMPUTATIONAL COMPLEXITY; ERROR CORRECTION; PROBABILITY; SET THEORY;

ERROR-CORRECTING CODES;

CODES (SYMBOLS);

EID: 0038784507     PISSN: 07349025     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/780627.780631     Document Type: Conference Paper

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