Grain-scale strain mapping for analysis of slip activity in polycrystalline B2 RuAl

Philosophical Magazine

Volumn 86, Issue 25-26, 2006, Pages 3995-4008

  Wu, A ^a   De Graef, M ^b   Pollock, T M ^a  

^a UNIVERSITY OF MICHIGAN   (United States)

^b CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DISLOCATIONS (CRYSTALS); MAPPING; MICROSTRUCTURE; RUTHENIUM ALLOYS; STRAIN; TRANSMISSION ELECTRON MICROSCOPY;

GRAIN-SCALE STRAIN MAPPING; HIGH-RESOLUTION SURFACE DISPLACEMENT MAPPING TECHNIQUE; SLIP SYSTEMS; STRAIN DEVELOPMENT;

POLYCRYSTALLINE MATERIALS;

EID: 33745641093     PISSN: 14786435     EISSN: 14786443     Source Type: Journal    
DOI: 10.1080/14786430600636344     Document Type: Article

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