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Volumn 106, Issue 8-9, 2006, Pages 637-644

A new technical approach to quantify cell-cell adhesion forces by AFM

Author keywords

018; 024; Atomic force microscopy; Cell adhesion; Force spectroscopy; Melanoma cells; Microscopic methods for biological specimens

Indexed keywords

ADHESION; ATOMIC FORCE MICROSCOPY; MORPHOLOGY; OPTICAL MICROSCOPY; TUMORS;

EID: 33745627477     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2005.08.003     Document Type: Article
Times cited : (195)

References (42)
  • 1
    • 0037681584 scopus 로고    scopus 로고
    • Comptes rendus de l'Academie des Sciences
    • Thiery J.P. Comptes rendus de l'Academie des Sciences. Physique 4(2) (2003) 289
    • (2003) Physique , vol.4 2 , pp. 289
    • Thiery, J.P.1
  • 15


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.