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Volumn 6153 I, Issue , 2006, Pages

Dissolution fundamentals of 193-nm methacrylate based photoresists

Author keywords

Dissolution; Line edge roughness; Photoresist; Reflectivity; Swelling

Indexed keywords

DEPROTECTION; LINE EDGE ROUGHNESS; QUARTZ CRYSTAL; TETRAMETHYLAMMONIUM HYDROXIDE;

EID: 33745596165     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.656540     Document Type: Conference Paper
Times cited : (3)

References (11)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.