AFM studies of environmental effects on nanomechanical properties and cellular structure of human hair

Ultramicroscopy

Volumn 106, Issue 8-9, 2006, Pages 755-764

  Bhushan, Bharat ^a   Chen, Nianhuan ^a  

^a OHIO STATE UNIVERSITY   (United States)

Author keywords

014 Scanning electron microscopy (SEM); 018 Atomic force microscopy (AFM); 024 Microscopic methods, specifically for biological specimens; Atomic force microscopy (AFM); Environmental effect; Human hair; Torsional resonance (TR) mode; Young's modulus

Indexed keywords

ATOMIC FORCE MICROSCOPY; CELL CULTURE; CONSUMER PRODUCTS; ELASTIC MODULI; MORPHOLOGY; SCANNING ELECTRON MICROSCOPY;

ENVIRONMENTAL EFFECT; HUMAN HAIR; MICROSCOPIC METHODS, SPECIFICALLY FOR BIOLOGICAL SPECIMENS; TORSIONAL RESONANCE (TR) MODE;

HUMAN ENGINEERING;

ADHESION; ARTICLE; ATOMIC FORCE MICROSCOPY; CALIBRATION; CELL STRUCTURE; CORRELATION ANALYSIS; ENVIRONMENTAL FACTOR; FILM; HAIR ANALYSIS; HAIR CELL; HUMAN; HUMIDITY; SCANNING ELECTRON MICROSCOPY; TEMPERATURE; TRANSMISSION ELECTRON MICROSCOPY; YOUNG MODULUS;

HAIR; HAIR PREPARATIONS; HUMANS; HUMIDITY; MICROSCOPY, ATOMIC FORCE; SURFACE PROPERTIES; TEMPERATURE;

EID: 33745593065     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2005.12.010     Document Type: Article

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