Morphological, nanomechanical and cellular structural characterization of human hair and conditioner distribution using torsional resonance mode with an atomic force microscope

Journal of Microscopy

Volumn 220, Issue 2, 2005, Pages 96-112

  Chen, N ^a   Bhushan, Bharat ^a  

^a OHIO STATE UNIVERSITY   (United States)

Author keywords

Atomic force microscopy (AFM); Cellular structure; Conditioner; Human hair; In plane heterogeneity; Torsional resonance (TR) mode

Indexed keywords

CELLS; CYTOLOGY; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; MICROSCOPES; SCANNING ELECTRON MICROSCOPY; SURFACE TREATMENT; TRIBOLOGY; VISCOELASTICITY;

ATOMIC FORCE; ATOMIC FORCE MICROSCOPY; ATOMIC-FORCE-MICROSCOPY; CELLULAR STRUCTURE; CELLULARS; CONDITIONER; HUMAN HAIR; IN-PLANE HETEROGENEITY; NANOMECHANICAL; TORSIONAL RESONANCE MODES;

ATOMIC FORCE MICROSCOPY;

COSMETIC;

ARTICLE; ATOMIC FORCE MICROSCOPY; CELL MEMBRANE; CELL STRUCTURE; CELL ULTRASTRUCTURE; CONTROLLED STUDY; ENVIRONMENTAL TEMPERATURE; HAIR ANALYSIS; HAIR FOLLICLE; HAIR GROWTH; HAIR LEVEL; HAIR ROOT; HUMAN; PHASE CONTRAST MICROSCOPY; PRIORITY JOURNAL; RIGIDITY; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY; VISCOELASTICITY;

EID: 28544445841     PISSN: 00222720     EISSN: 13652818     Source Type: Journal    
DOI: 10.1111/j.1365-2818.2005.01517.x     Document Type: Article

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