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Volumn 21, Issue 2, 2006, Pages 125-131

X-ray microtomographic imaging and analysis for basic research

Author keywords

[No Author keywords available]

Indexed keywords

3-D IMAGE PROCESSING; ELEMENTAL CONCENTRATIONS; INTEGRATED APPROACH; LINEAR ATTENUATION COEFFICIENTS; RESEARCH FACILITIES; SPATIAL RESOLUTION; STRUCTURE PROPERTY RELATIONSHIPS; SYNCHROTRON X RAYS;

EID: 33745498091     PISSN: 08857156     EISSN: 19457413     Source Type: Journal    
DOI: 10.1154/1.2204956     Document Type: Conference Paper
Times cited : (15)

References (16)
  • 14
    • 0029487456 scopus 로고
    • Proceedings of the 1995 IEEE International Conference on Image Processing (ICIP'95), Washington, DC 23-26, October 1995, Vol.
    • Th́venaz, P., Ruttimann, U. E., and Unser, M. (1995). Proceedings of the 1995 IEEE International Conference on Image Processing (ICIP'95), Washington, DC, 23-26, October 1995, Vol. III, pp. 228-231.
    • (1995) , vol.3 , pp. 228-231
    • Th́venaz, P.1    Ruttimann, U.E.2    Unser, M.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.