Determination of the density of states of semiconductors from steady-state photoconductivity measurements

Journal of Non-Crystalline Solids

Volumn 352, Issue 9-20 SPEC. ISS., 2006, Pages 1024-1027

  Schmidt, J A ^a,b   Longeaud, C ^c   Koropecki, R R ^a,b   Kleider, J P ^c  

^a Instituto de Desarrollo Tecnologico para la Industria Quimica   (Argentina)

^b UNIVERSIDAD NACIONAL DEL LITORAL   (Argentina)

^c UNIV PARIS SUD   (France)

Author keywords

Conductivity; Defects; Photoconductivity; Silicon

Indexed keywords

AMORPHOUS SILICON; APPROXIMATION THEORY; DEFECTS; ENERGY GAP; HYDROGENATION; PHOTOCONDUCTIVITY;

PHOTOCONDUCTIVE SEMICONDUCTORS; STANDARD HYDROGENATED AMORPHOUS SILICON;

SEMICONDUCTOR MATERIALS;

EID: 33745434940     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jnoncrysol.2005.10.038     Document Type: Article

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