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Volumn 894, Issue , 2006, Pages 197-204
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High-throughput characterization of shape memory thin films using automated temperature-dependent resistance measurements
a,c a a b b a,c |
Author keywords
[No Author keywords available]
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Indexed keywords
AUSTENITE;
CHARACTERIZATION;
FILM GROWTH;
HEAT RESISTANCE;
SHAPE MEMORY EFFECT;
TERNARY SYSTEMS;
FILM DEPOSITIONS;
TERNARIES;
THERMAL HYSTERESIS;
THIN FILMS;
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EID: 33745428776
PISSN: 02729172
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (16)
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References (17)
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