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Volumn 894, Issue , 2006, Pages 197-204

High-throughput characterization of shape memory thin films using automated temperature-dependent resistance measurements

Author keywords

[No Author keywords available]

Indexed keywords

AUSTENITE; CHARACTERIZATION; FILM GROWTH; HEAT RESISTANCE; SHAPE MEMORY EFFECT; TERNARY SYSTEMS;

EID: 33745428776     PISSN: 02729172     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (16)

References (17)
  • 11
    • 0004128136 scopus 로고
    • D. Van Nostrand Company, Inc.
    • R. M. Bozorth, Ferromagnetism, D. Van Nostrand Company, Inc. (1951).
    • (1951) Ferromagnetism
    • Bozorth, R.M.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.