Bond fluctuation of S/Se anchoring observed in single-molecule conductance measurements using the point contact method with scanning tunneling microscopy

Journal of the American Chemical Society

Volumn 128, Issue 24, 2006, Pages 7746-7747

  Yasuda, Satoshi ^a   Yoshida, Shoji ^a   Sasaki, Jiro ^a   Okutsu, Yoshitaka ^a   Nakamura, Tohru ^b   Taninaka, Atsushi ^a   Takeuchi, Osamu ^a   Shigekawa, Hidemi ^a  

^a UNIVERSITY OF TSUKUBA   (Japan)

^b NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ARTICLE; CHEMICAL BINDING; CONDUCTANCE; IMAGE ANALYSIS; MOLECULAR BIOLOGY; REACTION ANALYSIS; SCANNING TUNNELING MICROSCOPY; SINGLE MOLECULE CONDUCTANCE; STOCHASTIC MODEL;

EID: 33745378150     PISSN: 00027863     EISSN: None     Source Type: Journal    
DOI: 10.1021/ja062066l     Document Type: Article

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