Automatic detection of failure patterns using data mining

Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)

Volumn 3682 LNAI, Issue , 2005, Pages 1312-1316

  Han, Youngshin ^a   Kim, Junghee ^a   Lee, Chilgee ^a  

^a Sungkyunkwan University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTATIONAL COMPLEXITY; DATA MINING; DATABASE SYSTEMS; OPTIMIZATION; PATTERN RECOGNITION;

PATTERN EXTRACTION; SCHEMA; YIELD PATTERNS;

COMPUTER SYSTEM RECOVERY;

EID: 33745316618     PISSN: 03029743     EISSN: 16113349     Source Type: Book Series    
DOI: 10.1007/11552451_181     Document Type: Conference Paper

References (8)

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6. Carlos Onega, "Human based knowledge for the probe failure pattern classification with the use of a backpropagation neural network. Application on submicron linear technologies", IEEE/SEMI Advanced Semiconductor Manufacturing Conference, 1998
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8. Seiji Ishikawa, "Fail Bit Analysis System Semiconductor Memory Wafers", Japan International Electronics Manufacturing Technology Symposium, 1993