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Volumn 41, Issue 1, 2006, Pages 282-287
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Single-ion microbeam as a tool for low-dose radiation effects investigations
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 33745293446
PISSN: 17426588
EISSN: 17426596
Source Type: Conference Proceeding
DOI: 10.1088/1742-6596/41/1/030 Document Type: Conference Paper |
Times cited : (8)
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References (15)
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