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Volumn 41, Issue 1, 2006, Pages 282-287

Single-ion microbeam as a tool for low-dose radiation effects investigations

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EID: 33745293446     PISSN: 17426588     EISSN: 17426596     Source Type: Conference Proceeding    
DOI: 10.1088/1742-6596/41/1/030     Document Type: Conference Paper
Times cited : (8)

References (15)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.