Optimization of the performance of CVD diamond electron multipliers

Diamond and Related Materials

Volumn 15, Issue 4-8, 2006, Pages 827-832

  Trucchi, D M ^a   Scilletta, C ^a   Cappelli, E ^a   Merli, P G ^a   Zoffoli, S ^a   Mattei, G ^a   Ascarelli, P ^a  

^a CNR   (Italy)

Author keywords

Diamond film; Electrical properties' characterization; Electronic device structures; Surface characterization

Indexed keywords

ALGORITHMS; BACKSCATTERING; CHEMICAL VAPOR DEPOSITION; ELECTRON BEAMS; ELECTRON MULTIPLIERS; PARAMETER ESTIMATION; SCANNING ELECTRON MICROSCOPY;

ELECTRICAL PROPERTIES' CHARACTERIZATION; ELECTRONIC DEVICE STRUCTURES; FILM QUALITY; SURFACE CHARACTERIZATION;

DIAMOND FILMS;

EID: 33745282924     PISSN: 09259635     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.diamond.2005.12.038     Document Type: Article

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