A sensing circuit for micro-capacitance tomography

1st World Congress on Industrial Process Tomography

Volumn , Issue , 1999, Pages 395-401

  Evans, Iwan ^a   Somerville, Alan ^a   York, Trevor ^a  

^a UNIVERSITY OF MANCHESTER   (United Kingdom)

Author keywords

Capacitance; Measurement; Micro Tomography; VLSI

Indexed keywords

CAPACITANCE; ELECTRODES; MEASUREMENTS; TOMOGRAPHY;

CAPACITANCE CHANGE; CAPACITANCE TOMOGRAPHY; LARGE ARRAYS; LINEAR ARRAYS; MICRO-TOMOGRAPHY; SENSING CIRCUITS; SILICON CHIP; VLSI;

VLSI CIRCUITS;

EID: 33745263485     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (14)

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