Morphology and ellipsometry study of pentacene films grown on native SiO2 and glass substrates

Current Applied Physics

Volumn 6, Issue 5, 2006, Pages 925-930

  Kim, Chaeho ^a   Bang, Kyoungyoon ^b   An, Ilsin ^b   Kang, C J ^c   Kim, Y S ^c   Jeon, D ^a  

^a Seoul National University   (South Korea)

^b Hanyang University   (South Korea)

^c Myong Ji University   (South Korea)

Author keywords

Ellipsometry; Exciton; Organic thin film; Pentacene; X ray diffraction

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELLIPSOMETRY; EXCITONS; GLASS; OLEFINS; SUBSTRATES; X RAY DIFFRACTION ANALYSIS;

ELLIPSOMETRY SPECTRUM; ORGANIC THIN FILMS; PENTACENE; SURFACE IMAGES;

PLASTIC FILMS;

EID: 33745256475     PISSN: 15671739     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.cap.2005.01.041     Document Type: Article

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