Spectroscopic ellipsometry study of Ir(ppy)3 organic light emitting diode

Current Applied Physics

Volumn 6, Issue 5, 2006, Pages 833-838

  Nabatova Gabain, Nataliya ^a   Wasai, Yoko ^a   Tsuboi, Taiju ^b  

^a HORIBA LTD   (Japan)

^b KYOTO SANGYO UNIVERSITY   (Japan)

Author keywords

Ir(ppy)3; Layer thickness; Optical constants; Organic light emitting diodes; Spectroscopic ellipsometry

Indexed keywords

ELLIPSOMETRY; IRIDIUM; OSCILLATORS (ELECTRONIC); QUARTZ; REFRACTIVE INDEX; THIN FILMS;

IR(PPY)3; LAYER THICKNESS; OPTICAL CONSTANTS; ORGANIC LIGHT EMITTING DIODES; SPECTROSCOPIC ELLIPSOMETRY;

LIGHT EMITTING DIODES;

EID: 33745254512     PISSN: 15671739     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.cap.2005.01.034     Document Type: Article

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