Bayesian network for e/m impedance-based damage identification

Journal of Computing in Civil Engineering

Volumn 20, Issue 4, 2006, Pages 227-236

  Naidu, A S K ^a   Soh, C K ^a   Pagalthivarthi, K V ^b  

^a NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

^b INDIAN INSTITUTE OF TECHNOLOGY DELHI   (India)

Author keywords

Bayesian analysis; Damage; Networks

Indexed keywords

DATA REDUCTION; ELECTROMECHANICAL DEVICES; ELECTRONIC DOCUMENT IDENTIFICATION SYSTEMS; FAILURE ANALYSIS; FINITE ELEMENT METHOD; IDENTIFICATION (CONTROL SYSTEMS); NATURAL FREQUENCIES; PIEZOELECTRIC DEVICES; PROBABILISTIC LOGICS; PROBLEM SOLVING; TRANSDUCERS;

BAYESIAN ANALYSIS; DAMAGE; NETWORKS; SPARSE DATA AVAILABILITY;

TELECOMMUNICATION NETWORKS;

EID: 33745227254     PISSN: 08873801     EISSN: None     Source Type: Journal    
DOI: 10.1061/(ASCE)0887-3801(2006)20:4(227)     Document Type: Article

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