Nanoparticle size analysis with relaxation of induced grating by dielectrophoresis

Optics Express

Volumn 14, Issue 12, 2006, Pages 5755-5764

  Wada, Yukihisa ^a   Totoki, Shinichiro ^a   Watanabe, Masayuki ^a   Moriya, Naoji ^a   Tsunazawa, Yoshio ^a   Shimaoka, Haruo ^a  

^a SHIMADZU CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC PROPERTIES; DIFFRACTION; DIFFUSION; ELECTROPHORESIS; REFRACTIVE INDEX; SCATTERING; SENSITIVITY ANALYSIS;

DENSITY GRATING; DIELECTROPHORESIS; DIFFUSION COEFFICIENT; DYNAMIC LIGHT SCATTERING (DLS); NANOPARTICLE SIZE ANALYSIS;

NANOSTRUCTURED MATERIALS;

EID: 33745127783     PISSN: 10944087     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.14.005755     Document Type: Article

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