Conformance testing: Measuring the fit and appropriateness of event logs and process models

Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)

Volumn 3812 LNCS, Issue , 2005, Pages 163-176

  Rozinat, A ^a,b   Van Der Aalst, W M P ^a  

^a EINDHOVEN UNIVERSITY OF TECHNOLOGY   (Netherlands)

^b UNIVERSITY OF POTSDAM   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

MATHEMATICAL MODELS; METRIC SYSTEM; PROBLEM SOLVING; PROCESS CONTROL;

INFORMATION SYSTEMS; PROCESS MODELS;

INFORMATION MANAGEMENT;

EID: 33745116233     PISSN: 03029743     EISSN: 16113349     Source Type: Book Series    
DOI: None     Document Type: Conference Paper

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