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Volumn 203, Issue 7, 2006, Pages 1724-1728

Structural analysis of (Ga,Mn)N epilayers and self-organized dots using MeV ion channeling

Author keywords

[No Author keywords available]

Indexed keywords

EMISSION INTENSITY; PARTICLE INDUCED X RAY EMISSION (PIXE); RUTHERFORD BACKSCATTERING (RBS); WURTZITE;

ALUMINUM NITRIDE; ION EXCHANGE; MOLECULAR BEAM EPITAXY; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SEMICONDUCTOR QUANTUM DOTS; X RAY DIFFRACTION;

GALLIUM NITRIDE;

EID: 33745085563 PISSN: 18626300 EISSN: 18626319 Source Type: Journal
DOI: 10.1002/pssa.200565396 Document Type: Article

Times cited : (6)

References (8)

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