High sensitivity nanoscale mapping of elastic moduli

Applied Physics Letters

Volumn 88, Issue 23, 2006, Pages

  Ganor, Yaniv ^a   Shilo, Doron ^a  

^a TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

BARIUM TITANATE; FORCE MEASUREMENT; MAPPING; NANOTECHNOLOGY; PARAMETER ESTIMATION; SINGLE CRYSTALS;

FORCE MODULATION; MODULUS MAPPING; NANOINDENTATION; NANOSCALE MAPPING;

ELASTIC MODULI;

EID: 33745027843     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2210796     Document Type: Article

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