Atomistic simulation of rapid compression of fractured silicon carbide

Journal of Nuclear Materials

Volumn 352, Issue 1-3, 2006, Pages 22-28

  Romano, A ^a   Li, J ^b   Yip, S ^c  

^a PAUL SCHERRER INSTITUTE   (Switzerland)

^b The Ohio State University   (United States)

^c USA   (United States)

Author keywords

C0300; D0200; M0200; S0400

Indexed keywords

COMPACTION; CRACKS; MOLECULAR DYNAMICS; STRAIN; TENSILE STRESS;

C0300; D0200; M0200; S0400;

SILICON CARBIDE;

EID: 33745023632     PISSN: 00223115     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jnucmat.2006.02.038     Document Type: Article

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