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Volumn 563, Issue 1, 2006, Pages 268-273
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Hard X- and γ-ray measurements with a 3×3×2 mm3 CdZnTe detector
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Author keywords
CdZnTe; Compound semiconductors; Gamma ray detectors; X ray detectors
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Indexed keywords
CADMIUM COMPOUNDS;
DETECTORS;
GAMMA RAYS;
STOICHIOMETRY;
SYNCHROTRON RADIATION;
CDZNTE;
COMPOUND SEMICONDUCTORS;
ENERGY RESOLUTION;
GAMMA-RAY DETECTORS;
HOLE TRAPPING;
PHOTOPEAK EFFICIENCY;
RISETIME DISCRIMINATION (RTD);
X-RAY DETECTORS;
X RAYS;
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EID: 33744994588
PISSN: 01689002
EISSN: None
Source Type: Journal
DOI: 10.1016/j.nima.2006.01.088 Document Type: Article |
Times cited : (8)
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References (9)
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