In situ formation of a new Al-Pd-Mn-Si quasicrystalline phase on the pentagonal surface of the Al-Pd-Mn quasicrystal

Journal De Physique. IV : JP

Volumn 132, Issue , 2006, Pages 117-120

  Longchamp, J N ^a   Erbudak, M ^a   Weisskopf, Y ^a  

^a ETH ZURICH   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; AUGER ELECTRON SPECTROSCOPY; ELECTRON DIFFRACTION; SILICON; SUBSTRATES; THIN FILMS;

ICOSAHEDRAL AL-PD-MN QUASICRY STAL; PENTAGONAL SURFACE; QUASICRYSTALLINE PHASE; SECONDARY-ELECTRON IMAGING;

QUASICRYSTALS;

EID: 33744915265     PISSN: 11554339     EISSN: 17647177     Source Type: Conference Proceeding    
DOI: 10.1051/jp4:2006132023     Document Type: Conference Paper

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