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Volumn 4, Issue 1, 1997, Pages 179-196

Investigation of symmetry properties of surfaces by means of backscattered electrons

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EID: 0031326957     PISSN: 0218625X     EISSN: None     Source Type: Journal    
DOI: 10.1142/S0218625X97000183     Document Type: Article
Times cited : (42)

References (71)
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    • "Secondary-electron imaging" is an appropriate expression for identifying the technique, because secondary electrons are recorded for imaging the symmetry properties of surface species. The processes, on the other hand, can be described by "Kikuchi scattering." Alternatively, Chambers [S. A. Chambers, Surf. Sci. Rep. 16, 261 (1992)] introduced "incoherent medium-energy electron diffraction" to identify the processes, where the simultaneous occurrence of "incoherent" and "diffraction" might be misleading.
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  • 10
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    • B. L. Maschhoff, J.-M. Pan and T. E. Madey, Surf. Sci. 259, 190 (1991); J.-M Pan, B. L. Maschhoff, U. Diebold and T. E. Madey, ibid. 291, 381 (1993).
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  • 38
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    • and references therein
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    • S. A. Chambers, Science 248, 1129 (1990); W. F. Egelhoff Jr., J. W. Gadzuk, C. J. Powell and M. A. Van Hove, ibid.; X. D. Wang, Z. L. Han, B. P. Tonner, Y. Chen and S. Y. Tong, ibid.; D. P. Woodruff, ibid., p. 1131.
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    • Science
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    • S. A. Chambers, Science 248, 1129 (1990); W. F. Egelhoff Jr., J. W. Gadzuk, C. J. Powell and M. A. Van Hove, ibid.; X. D. Wang, Z. L. Han, B. P. Tonner, Y. Chen and S. Y. Tong, ibid.; D. P. Woodruff, ibid., p. 1131.
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.