Fabrication of Al nanoparticles and their electrical properties studied by capacitance-voltage measurements

Applied Surface Science

Volumn 252, Issue 15, 2006, Pages 5408-5410

  Noda, T ^a   Mano, T ^a   Koguchi, N ^a  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

Author keywords

Capacitance; Molecular beam epitaxy; Nanoparticle

Indexed keywords

CAPACITANCE; ELECTRIC PROPERTIES; ELECTRON TRAPS; HYSTERESIS; MOLECULAR BEAM EPITAXY; NANOSTRUCTURED MATERIALS; SEMICONDUCTING GALLIUM ARSENIDE;

AL NANOPARTICLES; GAAS MATRIX; NANOMETER; SUBSTRATE TEMPERATURE;

ALUMINUM;

EID: 33744545525     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2005.12.060     Document Type: Article

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