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Volumn 74, Issue 2, 2003, Pages 1098-1102

Method and apparatus to measure electromagnetic interference shielding efficiency and its shielding characteristics in broadband frequency ranges

Author keywords

[No Author keywords available]

Indexed keywords

CONDUCTIVE PLASTICS; COPPER; ELECTRIC LINES; ELECTRIC NETWORK ANALYZERS; ELECTROMAGNETIC SHIELDING; LIGHT ABSORPTION; LIGHT REFLECTION; SCATTERING PARAMETERS;

EID: 0037330314     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1532540     Document Type: Article
Times cited : (244)

References (16)
  • 2
    • 0013445067 scopus 로고
    • R. J. Deri, J. Appl. Phys. 59, 3013 (1986); J. J. Joo, S. M. Long, J. P. Pouget, E. J. Oh, A. G. MacDiarmid, and A. J. Epstein, Phys. Rev. B 57, 9567 (1998); L. Buravov and I. F. Shchegolev, Prib. Tekh. Eksp. 2, 171 (1971) [Instrum. Exp. Tech. 14, 528 (1971)].
    • (1986) J. Appl. Phys. , vol.59 , pp. 3013
    • Deri, R.J.1
  • 4
    • 0013445067 scopus 로고
    • [Instrum. Exp. Tech. 14, 528 (1971)]
    • R. J. Deri, J. Appl. Phys. 59, 3013 (1986); J. J. Joo, S. M. Long, J. P. Pouget, E. J. Oh, A. G. MacDiarmid, and A. J. Epstein, Phys. Rev. B 57, 9567 (1998); L. Buravov and I. F. Shchegolev, Prib. Tekh. Eksp. 2, 171 (1971) [Instrum. Exp. Tech. 14, 528 (1971)].
    • (1971) Prib. Tekh. Eksp. , vol.2 , pp. 171
    • Buravov, L.1    Shchegolev, I.F.2
  • 7
    • 0013341638 scopus 로고
    • Dielectric Materials and Applications, edited by A. R. von Hippel (Wiley, New York, 1961); J. Joo and A. J. Epstein, Rev. Sci. Instrum. 65, 2653 (1994).
    • (1994) Rev. Sci. Instrum. , vol.65 , pp. 2653
    • Joo, J.1    Epstein, A.J.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.