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Volumn 38, Issue 1, 2006, Pages 216-219
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Nano-scale view of atom intermixing at metal/semiconductor interfaces
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 33744529549
PISSN: 17426588
EISSN: 17426596
Source Type: Conference Proceeding
DOI: 10.1088/1742-6596/38/1/052 Document Type: Article |
Times cited : (26)
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References (5)
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