Monitoring the ordering in biomolecular films on vicinal silicon surfaces by reflectance difference/anisotropy spectroscopy

Applied Surface Science

Volumn 252, Issue 15, 2006, Pages 5462-5465

  Silaghi, Simona D ^a   Zahn, Dietrich R T ^a  

^a CHEMNITZ UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

DNA bases; Reflectance difference anisotropy spectroscopy; Vicinal Si(1 1 1)

Indexed keywords

ANISOTROPY; BIOFILMS; CARBON NANOTUBES; ENERGY GAP; SPECTROSCOPIC ANALYSIS;

ADENINE; DNA BASES; REFLECTANCE DIFFERENCE/ANISOTROPY SPECTROSCOPY; THYMINE; ULTRA-HIGH VACUUM (UHV); VICINAL SI(1 1 1);

SILICON;

EID: 33744509389     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2005.12.033     Document Type: Article

References (22)

1. Mauricio G., Visconti P., Arima V., D'Amico S., Biasco A., D'Amone E., Cingolani R., and Rinaldi R. Nanoletters 3 (2003) 479
2. Meeker K., and Ellis A.B. J. Phys. Chem. B 104 (2000) 2500
3. Aspnes D.E., and Studna A.A. Phys. Rev. Lett. 54 (1985) 1956
4. Aspnes D.E. J. Vac. Sci. Technol. B 3 (1985) 1498
5. Aspnes D.E., Harbison J.P., Studna A.A., and Florez L.T. J. Vac. Sci. Technol. A 6 (1988) 1327
6. Berkovits V.I., Kiselev V.A., and Safarov V.I. Surf. Sci. 211/212 (1989) 489
7. Hofmann Ph., Rose K.C., Fernandez V., Bradshaw A.M., and Richter W. Phys. Rev. Lett. 75 (1995) 2039
8. Goletti C., Springer C., Resch-Esser U., Esser N., Richter W., and Fimland B.O. Phys. Rev. B 61 (2000) 1681
9. Fleischer K., Chandola S., Esser N., Richter W., and Gilp J.F. Phys. Rev. B 67 (2003) 235318
10. Plembe M.E., Turner A.R., Shukla N., Bitzer T., Frederick B.G., Kitching K.J., and Richardson N.V. J. Chem. Soc. Faraday Trans. 91 (1995) 3627
11. Frederick B.G., Power J.R., Cole R.J., Perry C.C., Chen Q., Haq S., Bertrams Th., Richardson N.V., and Weightman P. Phys. Rev. Lett. 80 (1998) 4470
12. Frederick B.G., Cole R.J., Power J.R., Perry C.C., Chen Q., Richardson N.V., Weightman P., Verdozzi C., Jennison D.R., Schultz P.A., and Sears M.P. Phys. Rev. B 58 (1998) 10883
13. Weightman P. Phys. Stat. Sol. A 188 (2001) 1443
14. Miller E.K., Hingerl K., Brabec C.J., Heeger A.J., and Sariciftci N.S. J. Chem. Phys. 113 (2000) 789
15. Kampen T.U., Rossow U., Schumann M., Park S., and Zahn D.R.T. J. Vac. Sci. Technol. B 18 (2000) 2077
16. Di Natale C., Goletti C., Della Sala F., Drago M., Chiaradia P., Paolesse R., Lugli P., and D'Amico A. Appl. Phys. Lett. 77 (2000) 3164
17. Goletti C., Paolesse R., Di Natale C., Bussetti G., Chiaradia P., Froiio A., Valli L., and D'Amico A. Surf. Sci. 501 (2002) 31
18. Goletti C., Bussetti G., Chiaradia P., Sassella A., and Borghesi A. Org. Electron. 5 (2004) 73
19. Yasuda T., Aspnes D.E., Lee D.R., Bjorkman C.H., and Lucovsky G. J. Vac. Sci. Technol. A 12 (1994) 1152
20. Aspnes D.E., and Studna A.A. J. Vac. Sci. Technol. A 5 (1987) 546
21. Zahn D.R.T., and Silaghi S.D. Adv. Sol. State Phys. 45 (2005) 45
22. Cole R.J., Frederick B.G., and Weightman P. J. Vac. Sci. Technol. A 16 (1998) 3088