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Volumn 18, Issue 22, 2006, Pages 5163-5173
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Electrical conduction mechanisms and dielectric properties of thermally evaporated N-(p-dimethylaminobenzylidene)-p-nitroaniline thin films
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Author keywords
[No Author keywords available]
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Indexed keywords
ACTIVATION ENERGY;
DIELECTRIC LOSSES;
DIELECTRIC PROPERTIES;
ELECTRIC CONDUCTIVITY;
ELECTRON TRANSITIONS;
SEMICONDUCTING FILMS;
CARRIER HOPPING RATE;
CBH MODEL;
CORRELATED BARRIER HOPPING;
ELECTRONIC PARAMETERS;
POTENTIAL BARRIER;
ROOM TEMPERATURE CONDUCTIVITY;
THIN FILMS;
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EID: 33744486600
PISSN: 09538984
EISSN: 1361648X
Source Type: Journal
DOI: 10.1088/0953-8984/18/22/016 Document Type: Article |
Times cited : (40)
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References (40)
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