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Volumn II, Issue , 2005, Pages 1064-1069

Mixing global and local competition in genetic optimization based design space exploration of analog circuits

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITORS; DECISION THEORY; GENETIC ALGORITHMS; PROBLEM SOLVING; SIMULATED ANNEALING;

EID: 33646905095     PISSN: 15301591     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DATE.2005.208     Document Type: Conference Paper
Times cited : (9)

References (7)
  • 1
    • 0038141056 scopus 로고    scopus 로고
    • An evolutionary approach to automatic synthesis of high-performance analog integrated circuits
    • June
    • G.Alpaydin, S.Balkir, and G.Düdar. An evolutionary approach to automatic synthesis of high-performance analog integrated circuits. IEEE Tran. Evol. Comp., 7:240-252, June 2003.
    • (2003) IEEE Tran. Evol. Comp. , vol.7 , pp. 240-252
    • Alpaydin, G.1    Balkir, S.2    Düdar, G.3
  • 4
    • 0043136424 scopus 로고    scopus 로고
    • Performance trade-off analysis of analog circuits by normal-boundary intersection
    • G. Stehr, H. Graeb, and K. Antreich. Performance trade-off analysis of analog circuits by normal-boundary intersection. Design Automation Conference, 2003.
    • (2003) Design Automation Conference
    • Stehr, G.1    Graeb, H.2    Antreich, K.3
  • 5
    • 0037318922 scopus 로고    scopus 로고
    • Watson: Design space boundary exploration and model generation for analog and RFIC design
    • Feb.
    • D. Smedt and G.Gielen. Watson: Design space boundary exploration and model generation for analog and RFIC design. IEEE Trans. Computer-Aided Design, 22:213-224, Feb. 2003.
    • (2003) IEEE Trans. Computer-aided Design , vol.22 , pp. 213-224
    • Smedt, D.1    Gielen, G.2
  • 6
    • 52949101205 scopus 로고    scopus 로고
    • Holmes: Capturing the yield optimized design space boundaries of analog and RF integrated circuits
    • D. Smedt and G.Gielen. Holmes: Capturing the yield optimized design space boundaries of analog and RF integrated circuits. Design Automation and Test in Europe, 2003.
    • (2003) Design Automation and Test in Europe
    • Smedt, D.1    Gielen, G.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.