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Volumn 45, Issue 4 B, 2006, Pages 3301-3306
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Stochastic computing chip for measurement of Manhattan distance
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Author keywords
Chaos and CMOS; Manhattan distance; Stochastic computing
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Indexed keywords
CHAOS THEORY;
CMOS INTEGRATED CIRCUITS;
COMPUTATION THEORY;
RANDOM PROCESSES;
SUMMING CIRCUITS;
CHAOS AND CMOS;
EXCLUSIVE OR (EXOR) CIRCUITS;
MANHATTAN DISTANCE;
STOCHASTIC COMPUTING;
MICROPROCESSOR CHIPS;
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EID: 33646897902
PISSN: 00214922
EISSN: 13474065
Source Type: Journal
DOI: 10.1143/JJAP.45.3301 Document Type: Article |
Times cited : (7)
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References (10)
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