AFM studies on formation of new phase responsible for enhanced photoluminescence in light-emitting small molecular thin films

Journal of Luminescence

Volumn 121, Issue 1, 2006, Pages 132-136

  Shukla, Vivek Kumar ^a   Kumar, Satyendra ^a   Deva, Dinesh ^a  

^a INDIAN INSTITUTE OF TECHNOLOGY KANPUR   (India)

Author keywords

Atomic force microscopy (AFM); Organic light emitting devices (OLEDs); Photoluminescence (PL); Tris(8 hydroxyquinoline) aluminium (AlQ3)

Indexed keywords

ANNEALING; ATOMIC FORCE MICROSCOPY; LIGHT EMISSION; LIGHT EMITTING DIODES; OPTICAL PROPERTIES; PHOTOLUMINESCENCE; SURFACE ROUGHNESS;

ORGANIC LIGHT-EMITTING DEVICES (OLED); PHASE CHANGE; PHOTOLUMINESCENCE INTENSITY; TRIS(8-HYDROXYQUINOLINE) ALUMINIUM;

THIN FILMS;

EID: 33646831311     PISSN: 00222313     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jlumin.2005.11.003     Document Type: Article

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