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Volumn 483-485, Issue , 2005, Pages 341-346

Optical characterization of deep level defects in SiC

Author keywords

Deep levels; FTIR; Photoluminescence and absorption

Indexed keywords

ANNEALING; CARRIER LIFETIME; CRYSTAL DEFECTS; FOURIER TRANSFORM INFRARED SPECTROSCOPY; LUMINESCENCE;

EID: 33646813549     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/0-87849-963-6.341     Document Type: Conference Paper
Times cited : (63)

References (9)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.